Features:
1.High uniformity, large emitting area.
2.Lightweight design, high luminance.
3.Frame fixed method, more uniform stress, more fastness and more reliable when long time using.
4.Flexible outline, can be customized.
Applications:
1.Reflect light, unflatness surface inspection.
2.IC surface character inspection.
3.Condenser surface defect inspection.
Illumination property diagram Uniformity (Relative irradiance)
Model:LTS-3DM198-W
Imaging instance: IC chip defect inspection
Coding rule
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LTS-3DM116-R/BGW | / | Outer dia. φ116mm,Inner dia. φ25mm,Height 52.41mm | 24V | 6.5W/11.6W |
LTS-3DM175-R/BGW | / | Outer dia. φ175mm,Inner dia. φ35mm,Height 76.93mm | 24V | 7.2W/12.0W |
LTS-3DM198-R/BGW | / | Outer dia. φ198mm,Inner dia. φ30mm,Height 88.48mm | 24V | 12.5W/21.2W |
LTS-3DM260-R/BGW | / | Outer dia. φ260mm,Inner dia. φ48mm,Height 118.98mm | 24V | 17.3W/28.8W |
* UV & IR light can be customized as required. |